发明名称 |
Semiconductor devices having multi-level metal interconnects. |
摘要 |
<p>A self-aligned, self-planarized metallization scheme for multilevel interconnections using self-aligned windows in integrated circuits is described. Trenches are etched into a dielectric (27) and then, using an etch stop layer (29) on top of the dielectric (27) to prevent unwanted etching of the dielectric, self-aligned windows which expose portions of the substrate (21) are etched in the dielectric (23). Self-aligned windows can also be formed without a mask.</p> |
申请公布号 |
EP0336660(A1) |
申请公布日期 |
1989.10.11 |
申请号 |
EP19890303207 |
申请日期 |
1989.03.31 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
COCHRAN, WILLIAM T.;HILLS, GRAHAM W.;GARCIA, AGUSTIN M.;YEH, JENN L. |
分类号 |
H01L21/302;H01L21/00;H01L21/033;H01L21/3065;H01L21/3213;H01L21/60;H01L21/768;H01L23/522 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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