发明名称 Semiconductor devices having multi-level metal interconnects.
摘要 <p>A self-aligned, self-planarized metallization scheme for multilevel interconnections using self-aligned windows in integrated circuits is described. Trenches are etched into a dielectric (27) and then, using an etch stop layer (29) on top of the dielectric (27) to prevent unwanted etching of the dielectric, self-aligned windows which expose portions of the substrate (21) are etched in the dielectric (23). Self-aligned windows can also be formed without a mask.</p>
申请公布号 EP0336660(A1) 申请公布日期 1989.10.11
申请号 EP19890303207 申请日期 1989.03.31
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 COCHRAN, WILLIAM T.;HILLS, GRAHAM W.;GARCIA, AGUSTIN M.;YEH, JENN L.
分类号 H01L21/302;H01L21/00;H01L21/033;H01L21/3065;H01L21/3213;H01L21/60;H01L21/768;H01L23/522 主分类号 H01L21/302
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