Method of and system for high-speed, high-accuracy functional testing of memories in microprocessor-based units

摘要

A method of and system of high-speed, high-accuracy functional testing of memories in microprocessor-based units or boards under test includes a test system that is effectively permanently coupled to the unit under test bus structure during test execution and operates at the unit under test's clock rate. The test program may be stored in the unit under test's own memory, or may be electrically transferred from the test system's memory to the memory under test using a memory overlay technique. Memory testing speed may be further incresed by taking advantage of block move and compare features of newer microprocessors. An algorithm which exploits the block move and compare features is provided.