发明名称 REFLECTION DENSITY MEASURING APPARATUS
摘要 <p>PURPOSE:To make it possible to measure accurate reflection density readily without the effect of the fluctuation of the intensity of a pulse light source, by projecting the light from the pulse light source into a light transmitting plate provided between a material to be measured and the light source obliquely, and using the reflected light as reference light. CONSTITUTION:Light 43 from a pulse light source 41 is condensed in a plastic lens 42a through a lightguide 42. The light is projected on a material to be measured 31 such as test film for colorimetric analysis. A part of the light 43 is reflected from the surface of a transmitting plate 44 and received in a reference light detector 45 as a reference light. The remaining part of the light 43 is reflected from the film 31. A part 43c thereof is received with a reflected light detector 46. The reflection density of the material to be measured is obtained based on the output of the detectors 45 and 46. Therefore, the effect of the fluctuation in light intensity of the pulse light source is corrected, and the accurate measurement can be readily performed.</p>
申请公布号 JPH01253634(A) 申请公布日期 1989.10.09
申请号 JP19880080396 申请日期 1988.04.01
申请人 FUJI PHOTO FILM CO LTD 发明人 UEKUSA TADASHI
分类号 G01J1/16;G01N21/47;G01N21/86 主分类号 G01J1/16
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