| 摘要 |
<p>An electro-optic probe (10) for measuring an externally-applied field, e.g., an electric or magnetic field, is provided comprising a housing (12a); a beamsplitter (22b) mounted in the housing (12a) and optically coupled to a light source (16) and to an optical detector (20) via flexible fiber optic cables for conditioning an optical beam received from the light source (16) by extracting a portion of the optical beam having a first polarization, and for analyzing the portion of the optical beam by extracting a subportion of the optical beam having a second polarization and transmitting the subportion to the optical detector (20); and a crystal (28) mounted in the housing (12a) in fixed relation to the beamsplitter (22b) and optically coupled to the beamsplitter (22b), for receiving the portion of the optical beam, changing the first polarization to the second polarization for the subportion of the optical beam in response to an externally-applied field, and returning the subportion of the optical beam to the beamsplitter (22b).</p> |
