发明名称 BURN-IN PADS FOR TAB INTERCONNECT STRUCTURES
摘要 A tape automated bonding tape segment (10) carries on its top surface a printed circuit interconnect conductor high-density array (14) having a plurality of signal, power and ground conductors (16). Burn-in testing pads (40) are formed on either the top surface or the bottom surface of the tape segment, or both, and are connected to selected conductors. The testing pads are spaced apart and have a relatively low density to facilitate contact with test equipment, whereby a die connected to the printed circuit array can be tested.
申请公布号 WO8909493(A1) 申请公布日期 1989.10.05
申请号 WO1989US00965 申请日期 1989.03.14
申请人 DIGITAL EQUIPMENT CORPORATION 发明人 CHASE, RICHARD, A.
分类号 G01R31/26;G01R31/28;H01L21/60;H01L21/66;H01L23/495;H01L23/58 主分类号 G01R31/26
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