发明名称 A VARIABLE TEMPERATURE SCANNING TUNNELING MICROSCOPE
摘要 <p>A thermally compensated tube scanner scanning tunneling microscope utilizes two concentric piezoelectric tubes (11, 12) one (11) for scanning and one (12) for coarse translation as well as fine adjustment of sample position while in tunneling range. There are no mechanical components such as springs, levers, gears, or stepper motors which are known to result in considerable vibration sensitivity and thermal drift. Consequently, the standard mode of atomic resolution operation for the device is without vibration isolation and with a thermal drift of less than 1 angstrom per hour.</p>
申请公布号 WO1989009483(A1) 申请公布日期 1989.10.05
申请号 US1989001141 申请日期 1989.03.16
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