发明名称 ELECTROPHORETIC PATTERN ANALYZER OF GENETIC MATERIAL
摘要 PURPOSE:To exactly analyze an electrophoretic sample which has plural genetic materials to be inspected in a short period of time by subjecting the electrophoretic sample of at least one reference genetic material and >=1 genetic materials to be inspected to image processing. CONSTITUTION:A CCD two-dimensional image pickup device 1 optically reads the electrophoretic sample and outputs the reference image data which is the image data of a reference region and the image data to be inspected which is the image data of the region to be inspected. A means for extracting a reference band pattern extracts the reference band pattern relating to the band of a reference region from the reference image data. A means for extracting the band pattern to be inspected extracts the band pattern to be inspected relating to the band of the region to be inspected from the image data to be inspected. A band pattern comparing means compares the reference band pattern and the band pattern to be inspected and determines the kind of the region to be inspected, for example, whether the genetic material to be inspected is the same as a part or the whole of the reference genetic material or is different therefrom. The electrophoretic sample having the plural genetic materials to be inspected is thereby exactly analyzed in a short period of time.
申请公布号 JPH01250853(A) 申请公布日期 1989.10.05
申请号 JP19880079500 申请日期 1988.03.31
申请人 AISIN SEIKI CO LTD 发明人 YAMAMOTO TAKAKAZU;NAKAGAWA SHOICHI;MOMIYAMA MASAYOSHI
分类号 G01N33/50;B01D57/02;G01N27/447 主分类号 G01N33/50
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