发明名称 A METHOD OF EFFECTING ANALYSES OF SUCCESSIVE MATERIAL SAMPLES BY THE NIR-METHOD AND A SYSTEM FOR CARRYING OUT THE METHOD
摘要 <p>An NIR-analysis of a material sample is based on a very small sample in a test cup being brough into close engagement with a special optical unit, which will detect a radiation reflection from the surface area of the sample and thereby provide information as to the contents of relevant components such as water and protein. Under usual laboratory conditions both the test cup and the optical unit should be cleaned very effectively between successive operations for obtaining reliable results. With the invention the NIR-technique is utilized for a fully automatic on-line analysing of successive samples, viz. with the use of a test chamber (6) which is built together with the optical unit (12) and is open towards this unit through a restricted side opening (26). The test chamber (6) has a volume which is much larger than that of the known test cups, whereby the remnant-pollution of the following sample can be kept at an acceptable low level, without the test chamber having to be totally cleaned each time. A particularly critical area, however, is the material area just next to the optical unit (12, 64), and remnants at this place must by necessity be removed. The invention provides for a complete avoidance of such remnant deposits, in that between the side opening (26) of the test chamber and the optical unit (12, 64) there is placed a transparent, thin separation film (20), which between the successive operations is advanced for removal of the last used film area and for delivery of a new and entirely clean film area to the critical area.</p>
申请公布号 WO1989009388(A1) 申请公布日期 1989.10.05
申请号 DK1989000070 申请日期 1989.03.29
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