发明名称 Sequence of etching polysilicon in semiconductor memory devices
摘要 A semiconductor memory device such as a dymanic random access memory (DRAM) is formed by first forming a burried contact in a silicon wafer and patterning a series of transistors. After the transistors are patterned, oxide layers are applied and the transistors are etched. Cell bottom plates are then formed and electrical connections between the transistors and a periphery are established. The establishment of the transistors are to forming the cell bottom plates and its more efficient manufacture of the DRAM devices and increases manufacturing yield.
申请公布号 US4871688(A) 申请公布日期 1989.10.03
申请号 US19880189412 申请日期 1988.05.02
申请人 MICRON TECHNOLOGY, INC. 发明人 LOWREY, TYLER A.
分类号 H01L21/334;H01L21/8242;H01L27/105;H01L27/108 主分类号 H01L21/334
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