发明名称 Pattern matching apparatus employing compensation for pattern deformation
摘要 A pattern matching apparatus for comparing an input pattern of features with a reference pattern. Address information is stored in the reference pattern along with features, so that branching in a work memory which stores cumulative distances between the input and reference patterns may be effected. In this manner, memory requirements for storing reference patterns are reduced, and the number of required distance calculations also is reduced.
申请公布号 US4872201(A) 申请公布日期 1989.10.03
申请号 US19840657428 申请日期 1984.10.03
申请人 NEC CORPORATION 发明人 SAKOE, HIROAKI
分类号 G10L11/00;G06K9/62;G06T7/00;G10L15/00;G10L15/12 主分类号 G10L11/00
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