发明名称 Electron beam apparatus comprising a semiconductor electron emitter
摘要 An electron beam apparatus comprising a semiconductor electron emitter whose emissive surface dimensions are determined by dimensions of a p-n junction provided in the semiconductor element. By optimizing the dimensions of the emissive surface in relation to the electron-optical properties of the apparatus, an emitter is realized which combines optimum beam formation or imaging with a sufficiently large beam current and a high beam current density as required by the apparatus.
申请公布号 US4871911(A) 申请公布日期 1989.10.03
申请号 US19870077060 申请日期 1987.07.17
申请人 U.S. PHILIPS CORPORATION 发明人 VAN GORKOM, GERARDUS G. P.;HOEBERECHTS, ARTHUR M. E.;VAN DER MAST, KAREL D.;TOLNER, HARM
分类号 H01J1/30;H01J1/308;H01J37/073 主分类号 H01J1/30
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