发明名称 |
Electron beam apparatus comprising a semiconductor electron emitter |
摘要 |
An electron beam apparatus comprising a semiconductor electron emitter whose emissive surface dimensions are determined by dimensions of a p-n junction provided in the semiconductor element. By optimizing the dimensions of the emissive surface in relation to the electron-optical properties of the apparatus, an emitter is realized which combines optimum beam formation or imaging with a sufficiently large beam current and a high beam current density as required by the apparatus.
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申请公布号 |
US4871911(A) |
申请公布日期 |
1989.10.03 |
申请号 |
US19870077060 |
申请日期 |
1987.07.17 |
申请人 |
U.S. PHILIPS CORPORATION |
发明人 |
VAN GORKOM, GERARDUS G. P.;HOEBERECHTS, ARTHUR M. E.;VAN DER MAST, KAREL D.;TOLNER, HARM |
分类号 |
H01J1/30;H01J1/308;H01J37/073 |
主分类号 |
H01J1/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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