发明名称 Selective etching process
摘要 By adjusting the AC field conditions, i.e., by grounding the environment of a substrate being etched with a chlorine-containing plasma, a significant increase in etch selectivity is achieved. By applying a similar AC field adjustment to the reaction chamber surfaces, excellent etch uniformity is achieved in conjunction with excellent selectivity.
申请公布号 US4871420(A) 申请公布日期 1989.10.03
申请号 US19880150490 申请日期 1988.02.10
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY, AT&T BELL LABORATORIES 发明人 ALEXANDER, JR., FRANK B.;FOO, PANG-DOW;SCHUTZ, RONALD J.
分类号 H01L21/3065;H01L21/3213 主分类号 H01L21/3065
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