发明名称 X-RAY EXAMINATION SYSTEM AND METHOD OF CONTROLLING AN EXPOSURE THEREIN
摘要 <p>An x-ray examination system comprising an x-ray generator, an image intensifier tube connected to an output optical path and an x-ray exposure control arrangement which measures the light image intensity LI at the output of the image intensifier during fluoroscope, and from the relationship derives the exposure value IEXP1 of the switch-on tube current required to provide a desired exposure density during subsequent fluorography with a tube voltage VFL and exposure time TEXP, and wherein LA is a predetermined constant.</p>
申请公布号 CA1262191(A) 申请公布日期 1989.10.03
申请号 CA19860507477 申请日期 1986.04.24
申请人 N.V.PHILIPS'GLOEILAMPENFABRIEKEN 发明人 SPAAK, WILLEM E.
分类号 G01N23/04;H04N5/32;H05G1/44;H05G1/46;(IPC1-7):H05G1/46 主分类号 G01N23/04
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