发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURE
摘要 PURPOSE:To easily work a bit line and to eliminate a need to open a window for bit-line contact use by a method wherein the bit line is formed at the lower part of a storage node electrode and the bit line is formed at the lower part of a capacitor electrode. CONSTITUTION:A MOSFET is formed, via a gate insulating film 3, by a gate electrode 4 inside a memory cell separated by device-isolation insulating films 2. A bit line 10 is connected to a pad electrode 7 by a bit-line contact 9; the electrode 7 is connected to an n-type diffusion layer. A storage node electrode 13 is situated on the bit line 10 and an interlayer insulating film 11; it is connected to the electrode 7 by a contact 12. A side of the electrode 13 is utilized as a capacitor capacitance; even when a film thickness is made thick, a working operation of the bit line is not affected. A capacitor insulating film 14 and a capacitor electrode 15 are formed on the electrode 13. Since the electrode 15 is situated at the upper part of the bit line, it is not required to open a window to be used to form the bit-line contact in the electrode 15.
申请公布号 JPH01243573(A) 申请公布日期 1989.09.28
申请号 JP19880069626 申请日期 1988.03.25
申请人 TOSHIBA CORP 发明人 HAMAMOTO TAKESHI;HIEDA KATSUHIKO;HORIGUCHI FUMIO
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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