| 摘要 |
<p>1. Installation for X-ray fluorescence analysis and/or X-ray diffraction analysis, in which, in the case of X-ray fluorescence analysis, primary radiation from an X-ray emitter is directed on to a sample and then, via analyzer crystals, to a detector or, in the case of X-ray diffraction analysis, the primary radiation is directed on to a sample and reflected, at the respective diffraction angle, on to the detector, the installation having coaxial goniometer circles, capable of being rotated and adjusted as selected, on which are mounted holders for the analyzer crystal, the sample and the detector, and being characterized by three concentric goniometer circles, whereby the first goniometer circle (G1) has, at one point on its perimeter, a holder (KT1) for a monochromator crystal and, at its centre, a holder (KT2) for the analyzer crystal (AK), the second goniometer circle (G2) is equipped with a holder (PT) for the sample (P), the holder being such that it can be moved in a radial direction from the perimeter to the centre, and the third goniometer circle (G3) carries the detector (D).</p> |
