发明名称 Heterostructure transistor having a germanium layer on gallium arsenide and a method for manufacturing the same using molecular beam expitaxial growth.
摘要 <p>A heterostructure bipolar transistor is formed by a process of steps of holding an N-type gallium arsenide body (3) used as an emitter region in a high vacuum of 10<-><9> torr to 10<-><1><3> torr at a first temperature of 400 DEG C to 1,000 DEG C where arsenic on a surface of the gallium arsenide body drift away, lowering the first temperature to a second temperature of 300 DEG C to 400 DEG C to start a molecular beam exitaxial growth of a germainum, and forming an N-type germanium layer (4) used as a collector region.</p>
申请公布号 EP0334682(A2) 申请公布日期 1989.09.27
申请号 EP19890303043 申请日期 1989.03.28
申请人 NEC CORPORATION 发明人 KAWANAKA, MASAFUMI C/O NEC CORPORATION;KIMURA, TOORU C/O NEC CORPORATION;SONE, JUN'ICHI C/O NEC CORPORATION
分类号 C30B23/08;C30B29/42;H01L21/20;H01L21/203;H01L21/331;H01L29/267;H01L29/73;H01L29/737 主分类号 C30B23/08
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