| 摘要 |
PURPOSE:To detect the 2nd elliptically polarized light strength corresponding to the recording information of a recording medium even without using an analyzer and to execute the reproduction of the recorded information thereof by constituting so as to give the almost linear polarized light corresponding to the inclination of the elliptical axis of the 2nd elliptically polarized light to a light strength detector. CONSTITUTION:The 1st elliptically polarized light B radiated on a magnetic film 17 is reflected thereby and becomes 2nd elliptically polarized lights C, C' corresponding to the magnetizing direction of the magnetized film 17 of the recording medium 16 having a different magnetizing direction according medium to a recording information. The polarized light C, C' are then made incident on a 1/4 wavelength plate 20 again and incident on a polarized light beam splitter 18 after being converted into the almost linear polarized lights D, D' having the polarized light bearing of 2thetalambda+ or -thetak' from the linear polarized light A emitted from a semiconductor laser 2. The almost linear polarized light D, D' are reflected in the direction of a photodiode 14 in the polarized light beam splitter 18 and detected as the variations F, F' in the strength of the almost linear polarized light D, D' in the photodiode 14. |
