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发明名称
SEMICONDUCTOR TESTER
摘要
申请公布号
JPH01240875(A)
申请公布日期
1989.09.26
申请号
JP19880068808
申请日期
1988.03.22
申请人
MITSUBISHI ELECTRIC CORP
发明人
NISHIMURA YASUMASA;NIINOU MITSUKI
分类号
G01R31/26;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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