发明名称 Resist material and process for information of resist patterns.
摘要 <p>A pattern-forming resist material comprises a water-soluble polymeric material having at least one hydroxyl group in the molecular structure thereof and a photo-acid generator which, during exposure to radiation, does not cause cross-linking of the polymeric material, but release an acid upon reaction with the polymeric material. The resist material may be negative-working and is particularly suitable for deep ultraviolet exposure. On heating, the acid causes dewatering of the unsolubilizing polymeric material so that the resist material can be developed with water to form very fine resist patterns without swelling thereof.</p>
申请公布号 EP0333407(A2) 申请公布日期 1989.09.20
申请号 EP19890302448 申请日期 1989.03.13
申请人 FUJITSU LIMITED 发明人 ABE, NAOMICHI
分类号 G03F7/38;G03F7/004;G03F7/038;G03F7/20;G03F7/30 主分类号 G03F7/38
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