发明名称 Surface examining apparatus
摘要 A surface examining apparatus in which a surface to be examined is scanned by a light, whereby scanning position information, depth information and reflected light amount information are obtained and at least the image of the surface to be examined is displayed on the basis of such information.
申请公布号 US4867554(A) 申请公布日期 1989.09.19
申请号 US19880146702 申请日期 1988.01.21
申请人 CANON KABUSHIKI KAISHA 发明人 MATSUMURA, ISAO
分类号 A61B3/12;A61B3/13;A61B3/14 主分类号 A61B3/12
代理机构 代理人
主权项
地址