INSPECTION OF SURFACE DEFECT FOR ELECTRONIC COMPONENT,申请号JP19880061688-传众专利搜索

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发明名称	INSPECTION OF SURFACE DEFECT FOR ELECTRONIC COMPONENT
摘要
申请公布号	JPH01233351(A)	申请公布日期	1989.09.19
申请号	JP19880061688	申请日期	1988.03.14
申请人	MURATA MFG CO LTD	发明人	HIRAMATSU YOICHI
分类号	G01N21/84;G01N21/88;G01N21/93	主分类号	G01N21/84
代理机构		代理人
主权项
地址

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