发明名称 |
Semiconductor devices with silicon-on-insulator structures. |
摘要 |
<p>For fabricating a CMOS SOI structure on a silicon substrate (1) having a (110) plane an insulating SiO2 layer (2) is formed; an opening (2 min ) is formed in the SiO2 layer to expose a part of the substrate (1); a polycrystalline or amorphous silicon layer (3) is deposited on the SiO2 (2) and in the opening (2 min ); the deposited silicon layer (3) is divided into islands (3A, 3B) so that a first island (3A) includes the opening (2 min ) whilst a second island (3B) does not; a laser light (LB) is irradiated onto the islands (3A, 3B) so as to melt the islands; when the laser light irradiation is discontinued the melted islands are recrystallized so that the first island (3AR) forms a (110) plane whilst the second island (3BR) forms a (100) plane; and on the first island (3AR) a p-channel MOS FET is fabricated whilst on the second island (3BR) an n-channel MOS FET is fabricated.</p> |
申请公布号 |
EP0331811(A2) |
申请公布日期 |
1989.09.13 |
申请号 |
EP19880120896 |
申请日期 |
1988.12.14 |
申请人 |
FUJITSU LIMITED |
发明人 |
HASEGAWA, MITSUHIKO C/O FUJITSU LIMITED |
分类号 |
H01L27/08;H01L21/20;H01L21/336;H01L21/762;H01L21/8238;H01L21/84;H01L27/092;H01L29/78;H01L29/786 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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