发明名称 DEFECT INSPECTING METHOD
摘要 PURPOSE:To detect principally a band-shape defect which can not be detected before by employing an image pickup camera as a camera which has such a linear image sensor whose longitudinal-lateral shape ratio of one unit element is >=(1:50) and providing a swing and tilt mechanism to its sensor fitting part. CONSTITUTION:The image pickup camera is used as the camera which has the linear array image sensor 1a whose longitudinal-lateral shape ratio of one unit element 6a is >=(1:50). The swing and tilt mechanism is provided to the fitting part of the sensor 1a. The image of an element 6a of the sensor 1a corresponds to a unit equivalent visual field 7 on a running sheet 3 to be scanned. Defects 4 and 5 which are long in a scanning direction are added optically. The accumulation of errors due to electronic addition and a decrease in defect deciding ability are eliminated. When the position of the sensor 1a is FF, a focusing position is E'F' because of the swing and tilt mechanism and the focus is obtained on the sheet 3. Consequently, the detection of principally the band-shaped defect which can not be detected before is enabled.
申请公布号 JPH01216243(A) 申请公布日期 1989.08.30
申请号 JP19880040865 申请日期 1988.02.25
申请人 HIYUUTEC:KK 发明人 MIHARA TOSHIAKI
分类号 G01N21/84;G01N21/89;G01N21/892;H04N5/225;H04N5/335 主分类号 G01N21/84
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