发明名称 METHOD AND APPARATUS FOR ADHERING SEMICONDUCTOR SUBSTRATE
摘要 <p>PURPOSE:To obtain an adhered state of a whole surface adherence with a small amount of adhering material by coating the surface of a wafer with wax, then inverting and steadily placing it on a preheated surface plate, and eccentrically circularly moving it along the outer periphery of the wafer while pressurizing a press head. CONSTITUTION:A wafer is inverted and placed on a surface plate 3 preheated to approx. 80-120 deg.C, and the wafer 1 is steadily placed at a predetermined position on the plate through a wax film 2. A press head 4 having substantially the same size as the diameter of the wafer is pressed on the rear face of the wafer to pressurize it. Then, the center of the head 4 is displaced by (d) from the center (o) of the wafer, and the push rod 5 of the head 4 is so eccentrically rotatably moved as to move the center (o) of the wafer on a circle having a radius (d) at the center (o) of the wafer as a center. Thus, the operation of eccentrically moving the head and pressing it to the rear face of the wafer is repeated to obtain a completely contact state without air bubble remainder over the whole surface of the wafer.</p>
申请公布号 JPH01216540(A) 申请公布日期 1989.08.30
申请号 JP19880042557 申请日期 1988.02.24
申请人 SHOWA DENKO KK;SHOWA DENKO SILICON KK 发明人 OSAWA YUJI
分类号 H01L21/304;B23Q3/08;B29C65/00;B29C65/48;B29C65/54 主分类号 H01L21/304
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