发明名称 THERMAL SHOCK TESTING METHOD
摘要 PURPOSE:To make it possible to perform a severe thermal shock test at 0 deg.C or lower simply, by inputting liquid nitrogen in a container made of foamed styrol and the like, and directly immersing a sample under test in the liquid nitrogen. CONSTITUTION:Liquid nitrogen 2 is inputted in a container made of foamed styrol and the like. A sample under test 3 is directly immersed in the liquid nitrogen. When a bias power source 5 is connected to the sample under test 3 through lead wires 4, a low temperature bias test can be performed under the severe conditions at 0 deg.C or lower. The thermal shock test can be performed simply under the more severe conditions than cold water by directly immersing the material under test into the liquid nitrogen in this way.
申请公布号 JPH01214775(A) 申请公布日期 1989.08.29
申请号 JP19880041158 申请日期 1988.02.23
申请人 NEC CORP 发明人 SHIBATA NOBORU
分类号 G01R31/26;G01R31/30;H01L21/66 主分类号 G01R31/26
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