发明名称 DIAGNOSTIC APPARATUS OF ABNORMALITY OF X-RAY DIFFRACTION APPARATUS
摘要 PURPOSE:To identify a cause of abnormality with high precision, by a method wherein a plurality of diagnostic elements are determined beforehand, measured comparative data are compared with normal data, a possible cause of abnormality is taken out of stored data if there is any abnormality, and it is executed for the diagnostic elements in a plurality. CONSTITUTION:For executing a diagnosis of abnormality, comparative data are measured practically in an X-ray diffraction apparatus 35, the comparative data thus obtained are compared with corresponding normal data in a normal data storage means 30 to determine 38 whether said data are abnormal or not, and a display is made as normal in a display means 40 when no abnormal data are present. When the abnormal data are present, on the other hand, it is determined whether the abnormal data are one or not. When a corresponding cause of abnormality is one, the cause of abnormality is specified at that time point and displayed 40. When a plurality of corresponding causes of abnormality are present, a display is made as diagnosis impossible in the means 40. It is also possible to enumerate and display a plurality of causes of abnormality which can not be specified. In the case when the abnormality data are present in a plurality, moreover, a cause of abnormality being in common to each of the abnormality data is determined 38, and when the common cause of abnormality is specified to be one, this cause of abnormality is displayed 40.
申请公布号 JPH01214746(A) 申请公布日期 1989.08.29
申请号 JP19880039509 申请日期 1988.02.24
申请人 RIGAKU DENKI KK 发明人 YOSHIZAWA KAZUYUKI;YAMADA YOSHIYUKI;OBATA YASUSHI
分类号 G01N23/207 主分类号 G01N23/207
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