发明名称 DEVICE FOR SUCKING SUBSTRATE
摘要 PURPOSE:To obtain a suction apparatus where a nearly uniformly flattening and correcting force is obtained over the whole face of a substrate while the stability and certainty are maintained during an automatic transfer operation of the substrate such as a wafer or the like by a method wherein two or more through holes are made in a stage separately from each other and two or more support members which are inserted individually inserted into the through holes and moved upward and downward are installed. CONSTITUTION:Two or more through holes 10a-10c piercing a mounting face 5 are made separately from each other in a stage where the mounting face 5 whose shape is nearly identical to the external shape of a substrate (W) to be flattened and corrected is contained, protruding parts 50 scattered on the whole face of the mounting face 5 are distributed and formed nearly evenly and the rear of the substrate (W) is sucked by reducing a pressure in recessed parts around the protruding parts 50 by following a reference plane prescribed by the upper face of said two or more protruding parts 50. In order to mount the substrate (W) on said mounting face 5 while its rear is brought into contact with the face and to separate the rear of the substrate (W) from the mounting face 5 by a prescribed amount, the following are installed: two or more support members 14a-14c which are inserted into said through holes 10a-10c and can be moved upward and downward; intake holes which are made at individual upper-end faces of the members and suck the rear of the substrate (W) when the substrate (W) is separated from the mounting face 5.
申请公布号 JPH01214042(A) 申请公布日期 1989.08.28
申请号 JP19880039206 申请日期 1988.02.22
申请人 NIKON CORP 发明人 AOYAMA MASAAKI
分类号 H01L21/683;H01L21/68 主分类号 H01L21/683
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