| 摘要 |
PURPOSE:To exactly correct and to obtain a high quality image by detecting reflecting original surface quality by the plural light quantity relation measured at the reflecting positions at plural angles against the incident light projected on the reflecting original. CONSTITUTION:A light source 10 is positioned at -45 deg. against the reflecting original 20, and the incident light NK is projected on the surface of the original 20. A detector 3 receives a reflecting light FK at the peripheral area of the original 20 at -90 deg.-+90 deg.. The position of the reflecting light FK which is reflected in the direction at 45 deg. from the incident light NK is set as a reference point 0 deg., and the detector 3 is continuously moved to -90 deg.-+90 deg., and at this time, reflectance is calculated by the light quantity of the reflecting light FK. Since the reflectance of the original possesses its own value according to the image quality, the image quality of the reflecting original 20 is easily and accurately detected so as to be effectively processed afterward. |
