ANALYTIC INSPECTING METHOD FOR SIGNAL FREQUENCY,申请号JP19880032452-传众专利搜索

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发明名称	ANALYTIC INSPECTING METHOD FOR SIGNAL FREQUENCY
摘要
申请公布号	JPH01207637(A)	申请公布日期	1989.08.21
申请号	JP19880032452	申请日期	1988.02.15
申请人	NEC HOME ELECTRON LTD	发明人	OHASHI MITSUO;NAKAGAWA JUN;TAKAHASHI NOBORU
分类号	G01R23/16;G01H3/08	主分类号	G01R23/16
代理机构		代理人
主权项
地址

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