发明名称 CONTROL FACILITIES TROUBLE MONITOR
摘要 <p>PURPOSE:To shorten the facility recovering time by comparing facility information at the time of detecting an abnormality and information at the time of a normality to detect quickly a concrete defective place. CONSTITUTION:For the information edited in an abnormality function related data editing circuit 8, a function corresponding normality operation time facility information storing circuit 11 stores the turn-on and turn-off condition of a relation sensor at the time of the normal action of respective function correspondences, the condition of the operation input and the condition of the control output as fixed information wholly. A nonconformity generating point detecting circuit 12 compares and collates all the fixed information and the data from the abnormality function related data editing circuit 8 and thus, detects which conditions are nonconformities concretely. In this case, since all elements are collated one by one, for example, it can be instantaneously detected which sensor is troubled. Thus, the facilities can be quickly recovered and the operation rate of the facilities can be improved.</p>
申请公布号 JPH01205210(A) 申请公布日期 1989.08.17
申请号 JP19880027774 申请日期 1988.02.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 WATABE TETSUO
分类号 G05B23/02 主分类号 G05B23/02
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