发明名称 SURFACE FLAW INSPECTION METHOD
摘要 PURPOSE:To make the same judgement of even a flaw which is present in any form with a human by calculating the density of flaws in a specific area and comparing it with a specific threshold, and judging whether or not there is the flaw in the specific area. CONSTITUTION:When an image which has flaws is inputted from a two-dimensional camera to a surface flaw inspection device, an A/D conversion part 6 performs sampling and binarization coding processing and image information on the specific area which is set previously in an area setting part 13 is stored in an image storage part 7 in order. A defect extraction part 8, on the other hand, reads the image information out of the image storage part 7 to extract the flaw which is present in the specific area, and the area of the extracted flaw is calculated by a flaw area calculation part 9 and stored in an area storage part 10 in order. Further, a flaw density calculation part 14 calculates the total area and when a comparison part 11 compares the total area with the specific value and judges that the total area is larger than the threshold level, the judgement result is transferred to an output part 12, which displays information showing that there is the flaw in the specific area on a display part 5.
申请公布号 JPH01201142(A) 申请公布日期 1989.08.14
申请号 JP19880023795 申请日期 1988.02.05
申请人 NISSAN MOTOR CO LTD 发明人 TEZUKA SHIGEKI;SUZUKI MOTOYUKI;MISHIMA YUKIHIKO
分类号 G01B11/30;G01N21/88;G01N21/93 主分类号 G01B11/30
代理机构 代理人
主权项
地址