SAMPLE TEMPERATURE CONTROLLER FOR ANALYZING DEVICE,申请号JP19880024687-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	SAMPLE TEMPERATURE CONTROLLER FOR ANALYZING DEVICE
摘要
申请公布号	JPH01199218(A)	申请公布日期	1989.08.10
申请号	JP19880024687	申请日期	1988.02.03
申请人	SHIMADZU CORP	发明人	AMITA KOUJI;MUTSUNO KOJI
分类号	G01N27/28;G05D23/00;G05D23/24	主分类号	G01N27/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

RAW MIX FOR PREPARING BUILDING PRODUCTS

FLYING VEHICLE COMPARTMENT

METHOD OF CONTROL CYCLE OF ARTICLE ROTATION SURFACING

METHOD OF SPICE CAKES PRODUCTION

METHOD OF PRODUCING HONEY-CURD CAKE

NUCLEAR QUADRUPOLE RESONANCE SYSTEM FOR DETECTION OF MINES AND LUGGAGE INSPECTION

METHOD AND APPARATUS FOR PULSED IONTOPHORETIC DRUG DELIVERY

Hybrid roof covering element

CARDIOVERSION SYNCHRONIZATION SYSTEM AND METHOD FOR AN ATRIAL DEFIBRILLATOR

ROLL-AND-GEAR EXTRUDER

MAGNETIC NANOCOMPOSITE COMPOSITIONS AND PROCESSES FOR THE PREPARATION AND USE THEREOF

DEVICE AND PROCESS FOR THE VAPORISATION OF MATERIAL

An optoelectronic assembly and method for fabricating the same

Method of surface modifying a medical tubing

Compositions and therapeutic methods involving isoflavones and analogues thereof

New process for the preparation of conjugated linoleic acid (cla)

Polyalkoxylated superamides optionally functionalised, use as emulsifiers

Method for producing exopolysaccharides

Cross-linked products with no blooming and reduced fogging