发明名称 ULTRASONIC FLAW DETECTING DEVICE
摘要 PURPOSE:To securely perform the ultrasonic flaw detection of a test material which varies in distance to the surface of the test material with places and is irregular in sound speed by converting a surface echo and a bottom surface echo into electric signals by a probe. CONSTITUTION:The probe 10 sends an ultrasonic wave into the test material 1 at constant intervals and receives the surface echo and bottom surface echo from the top surface and bottom surface of the test material 11. In this case, information for determining the closing time of a gate is obtained from the ultrasonic wave echo received by the probe 10 with an (n)th synchronizing signal and a gate start time is determined with an (n+1)th signal; and the flaw detection gate is opened for the gate width time to perform the flaw detection. Then the probe 10 is coupled with a scanner 65 by a coupler 64 and further connected to a scanner controller 66. The scanner 65 when inputting an X and a Y control signal from the controller 66 operates according to those signals to scan the probe 10 on the test material 11.
申请公布号 JPH01197650(A) 申请公布日期 1989.08.09
申请号 JP19880022096 申请日期 1988.02.03
申请人 HITACHI LTD;HITACHI ENG CO LTD 发明人 KATO MASAYUKI;YOSHIDA YOJI
分类号 G01N29/38;G01N29/04 主分类号 G01N29/38
代理机构 代理人
主权项
地址