发明名称 |
METHOD OF MANUFACTURING DIELECTRIC ISOLATION REGIONS FOR A SEMICONDUCTOR DEVICE |
摘要 |
<p>A method of manufacturing a semiconductor device which comprises a step of forming a first groove in a semiconductor layer, a step of filling the first groove with a first insulating film, a step of selectively etching the first insulating film in the first groove to form at least one second groove having a small width, and a step of filling the second groove with a second insulating film to form an isolation layer having a large width and substantially flush with the semiconductor layer.</p> |
申请公布号 |
EP0073025(B1) |
申请公布日期 |
1989.08.09 |
申请号 |
EP19820107583 |
申请日期 |
1982.08.19 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KAMEYAMA, SHUICHI;SHINOZAKI, SATOSHI;IWAI, HIROSHI |
分类号 |
H01L21/762;H01L21/763 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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