发明名称 X-RAY INSPECTING DEVICE
摘要 PURPOSE:To easily judge whether or not there is an internal defect in a body by multiplying a detected value of each data sampling position of an X-ray quantity detecting means by a corresponding attenuation constant. CONSTITUTION:Data at each sampling position of an X-ray image which is transmitted through a material 3 to be inspected is converted by an A/D converter 7a into a digital value, which is stored in a memory 7b temporarily and outputted to a multiplier 11b. Then the command signal from the control part of an image processor is outputted to a 1/alpha setter 11a to assign the address corresponding to the sampling position of the data outputted from the memory 7b. Consequently, the 1/alpha setter 11a outputs the data (1/alpha) stored in the address. The multiplier 11b multiplies the output data of the memory 7b by the output data of the 1/alpha setter 11a and outputs the value to a memory 11c. Consequently, even when the material to be inspected has ununiform thickness in an X-ray irradiation direction, the brightness of a visible image is uniformed and light and shade due to the defect are easily discriminated.
申请公布号 JPH01197641(A) 申请公布日期 1989.08.09
申请号 JP19880022071 申请日期 1988.02.03
申请人 HITACHI CONSTR MACH CO LTD 发明人 HAYAKAWA YASUO
分类号 G01N23/18 主分类号 G01N23/18
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