发明名称 Apparatus and process for improved detection limits in mass spectrometry
摘要 A system and method for detecting trace levels of a sample gas in a mass spectrometer having a vacuum chamber with a vacuum pump, an ionizer, extracting and imaging lens and a detector. A high pressure sample gas pulse is introduced into the vacuum chamber through a small orifice to produce a high density of sample gas in a region near the orifice. The density of the sample gas pulse is sufficient to substantially sweep residual background gas from the path of the pulse. A portion of the sample gas pulse is ionized and ions are extracted and imaged.
申请公布号 US4855594(A) 申请公布日期 1989.08.08
申请号 US19880163507 申请日期 1988.03.02
申请人 AIR PRODUCTS AND CHEMICALS, INC. 发明人 KIMOCK, FRED M.;PHILLIPS, JOHN H.
分类号 B01D59/44;H01J49/16 主分类号 B01D59/44
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