发明名称 |
Apparatus and process for improved detection limits in mass spectrometry |
摘要 |
A system and method for detecting trace levels of a sample gas in a mass spectrometer having a vacuum chamber with a vacuum pump, an ionizer, extracting and imaging lens and a detector. A high pressure sample gas pulse is introduced into the vacuum chamber through a small orifice to produce a high density of sample gas in a region near the orifice. The density of the sample gas pulse is sufficient to substantially sweep residual background gas from the path of the pulse. A portion of the sample gas pulse is ionized and ions are extracted and imaged.
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申请公布号 |
US4855594(A) |
申请公布日期 |
1989.08.08 |
申请号 |
US19880163507 |
申请日期 |
1988.03.02 |
申请人 |
AIR PRODUCTS AND CHEMICALS, INC. |
发明人 |
KIMOCK, FRED M.;PHILLIPS, JOHN H. |
分类号 |
B01D59/44;H01J49/16 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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