发明名称 MULTILAYER INTERCONNECTION
摘要 PURPOSE:To inhibit the increase of thickness, and to stabilize connection between conductors by applying and forming a metallic mask layer into an inorganic group insulating layer and shaping a stepped section into a through-hole, using the metallic mask layer as a mask. CONSTITUTION:A first SiO2 layer 2 is applied onto a lower-layer Al electrode 1, and a metallic mask layer 3, a center of which has a hole, is formed. An SiO2 layer 4 is applied through a sputtering method, the hole of a resist in size smaller than the outer circumference of the mask layer 3 in a through-hole section and larger than the hole at the center is shaped, and the SiO2 layer 4 is wet-etched. An etchant reaches the mask layer, but Cr functions as a second mask because Cr is not dissolved into the etchant, the central section in which there is no Cr is etched, and the through-hole in which there is a stepped section is formed. Accordingly, the increase of thickness is inhibited, and connection between conductors is stabilized.
申请公布号 JPH01196854(A) 申请公布日期 1989.08.08
申请号 JP19880023209 申请日期 1988.02.02
申请人 NEC CORP 发明人 SUDA HIROSHI
分类号 H01L23/522;H01L21/768;H05K3/46 主分类号 H01L23/522
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