Arrangement for inspecting light waveguide end faces

摘要

The invention relates to an arrangement of inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the airgap between a plane transparent plate and the end face of a light waveguide abutting on said plate. A less elaborate measuring device requiring less space is obtained in that the measuring light is led towards the end faces to be observed, via the light waveguides (1, 2, 23, 24).