| 摘要 |
Disclosed is an ophthalmic examination apparatus in which a laser beam is deflected at an eye fundus under examination to scan the eye fundus two-dimensionally, and light reflected back from the eye fundus is detected for photoelectric conversion to obtain information about the eye fundus. The apparatus includes a first optical deflector for deflecting the laser beam to scan the eye fundus in one direction and a second optical deflector for deflecting the laser beam to scan the eye fundus in a direction perpendicular to the scanning direction of the first optical deflector. A detection slit is provided which extends perpendicularly to the scanning direction of the second optical deflector and which is disposed at a position optically conjugate with the eye fundus. The reflected light is deflected in a direction parallel to the detection slit, but stationary in a direction that is perpendicular to the slit. The slit serves to remove unrequired scattered light from the optical system for examining the eye.
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