发明名称 Arrangement for exposing semiconductor wafers by means of a synchrotron radiation in lithographic equipment
摘要 An arrangement or apparatus for exposing semiconductor wafers by means of a synchrotron radiation, wherein a mask and semiconductor wafer are movable in a common, perpendicular direction relative to the direction of the X-ray beam in order to sweep an exposure field. The optical devices are provided for observing adjustment marks on the mask and semiconductor wafer to create control signals for the adjustment of the mask and wafer relative to each other. The beam radiation is conducted in a tube having a rectangular slot-shaped radiation window, which is arranged immediately adjacent to the mask and the optical devices are provided next to the beam feed tube and aligned to a part of the exposure fields lying outside of the impingement area of the beam leaving the radiation window.
申请公布号 US4856037(A) 申请公布日期 1989.08.08
申请号 US19870073435 申请日期 1987.07.15
申请人 SIEMENS AKTIENGESELLSCHAFT;KARL SUESS KG GMBH & CO.;FRAUENHOFER GESELLSCHAFT 发明人 MUELLER, KARL-HEINZ;BETZ, HANS;VACH, WILHELM;KRENNER, JOHANN
分类号 G03F9/00;G03F7/20;H01L21/027;H01L21/68 主分类号 G03F9/00
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