发明名称 ELECTRON SPIN RESONANCE MICROSCOPE
摘要 PURPOSE:To derive a two-dimensional electron spin distribution of a sample by providing a local magnetic field modulation coil so as to be opposed to the sample and scanning two-dimensionally the sample or a modulation coil by using said coil. CONSTITUTION:By an XY stage 13, a sample 23 is scanned in the X and Y directions and a magnetic field sweep is executed in each position, and by a modulation coil 25, a magnetic field modulation is executed by, for instance, 100kHz and an absorbing signal by an electron spin resonance is detected. A detecting signal is fetched in a form that a carrier of, for instance, 9GHz has been modulated by 100kHz from a directional coupler 31, detected by a detector 33, and also, only a 100kHz component is detected by a narrow-band amplifier 35. By bringing said component to phase detection by 100kHz from a modulating signal generator 27, a resonance signal by an electron spin of a part opposed to a modulation coil is detected as a differential waveform. In such a way, a two-dimensional electron spin distribution of the sample can be derived.
申请公布号 JPH01195354(A) 申请公布日期 1989.08.07
申请号 JP19880020983 申请日期 1988.01.29
申请人 JEOL LTD 发明人 MIKI TOSHIKATSU;IKETANI MOTOMI
分类号 A61B5/05;A61B5/055;A61B10/00;G01N24/10 主分类号 A61B5/05
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