| 摘要 |
<p>PURPOSE:To perform a burn-in test in a tape state as it is by forming in advance an electrode pattern for the test on a tape member. CONSTITUTION:Electrode patterns 10a, 10b are formed along the insides of perforation holes 4 at both lateral side edges of a tape member 1, to be applied with an operation power source voltage for a burn-in test. It is directly connected to at least necessary one (or a plurality of) of lead terminals at devices. The patterns 10a, 10b are formed commonly continuously to the devices, or the pattern 10a is solely formed at each device. The pattern 10b side is commonly continuously formed. A test probe is sequentially connected to corresponding test pad 7c on the member 1 to perform a function test, thereby discriminating the propriety of each semiconductor element 3.</p> |
