发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To reduce cracks at a resin sealing part by so forming the shape of a tab as to improve the adhesive properties of the tab with the boundary of a resin and to alleviate a stress concentration at the time of allowing the solder of a lead to reflow or temperature cycle. CONSTITUTION:The tab 1 of the lead frame of a resin-sealed semiconductor device is formed in a-shaped metal thin plate structure. Thus, since the lower face of a pellet 1 placed on the tap 1 is almost exposed, a boundary between the pellet and the resin 5 is also formed on the lower face of the pellet 2, the area of an effective tab 1 is reduced, thereby alleviating a generated stress. Accordingly, the adhesive properties of both can be improved, and a stress concentration at the time of allowing the solder of an outer lead 3B to flow or temperature cycle can be moderated. Thus, a gap at the boundary between the pellet 2 and the resin 5 can be reduced. As a result, since the cracks of the sealing part of the resin 5 can be reduced, the reliability of a resin-sealed semiconductor device can be improved.</p>
申请公布号 JPH01187841(A) 申请公布日期 1989.07.27
申请号 JP19880010733 申请日期 1988.01.22
申请人 HITACHI LTD;HITACHI TOBU SEMICONDUCTOR LTD;HITACHI MICRO COMPUT ENG LTD 发明人 OBATA KAZUHIKO;NISHI KUNIHIKO;NISHIDA TAKAFUMI;TANAKA AKIRA;KIMOTO RYOSUKE
分类号 H01L23/28;H01L23/50 主分类号 H01L23/28
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