发明名称 Method and circuit arrangement for the evaluation of photoelectrically obtained difference scanning signals from narrow and low-contrast structures
摘要 The invention relates to a method and a circuit arrangement for the evaluation of photoelectrically obtained difference scanning signals from narrow and low-contrast structures. According to the invention, polarity-dependent trigger signals from the difference signal are counted before and after scanning of a narrow structure, while polarity-dependent trigger signals from the difference signal inside a structure reset the counting process. As a function of the counter condition, the transmission path for the zero pulse is respectively activated or locked. <IMAGE>
申请公布号 DE3836970(A1) 申请公布日期 1989.07.27
申请号 DE19883836970 申请日期 1988.10.31
申请人 JENOPTIK JENA GMBH, DDR 6900 JENA, DD 发明人 SPRING, KLAUS, DIPL.-ING.;KOEHLER, JOACHIM, DIPL.-ING., DDR 6902 JENA, DD
分类号 G06K9/38 主分类号 G06K9/38
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