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发明名称
MEASUREMENT OF IMPURITY IN COMPOUND SEMICONDUCTOR CRYSTAL
摘要
申请公布号
JPH01182738(A)
申请公布日期
1989.07.20
申请号
JP19880006518
申请日期
1988.01.13
申请人
SUMITOMO ELECTRIC IND LTD
发明人
SHIRAKAWA FUTATSU;TAKEBE TOSHIHIKO;UEDA TOSHIO
分类号
G01N21/63;H01L21/66
主分类号
G01N21/63
代理机构
代理人
主权项
地址
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