发明名称 Electrical signal sampling probe apparatus.
摘要 <p>An electrical signal sampling probe apparatus to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate (10) though which optical pulses are focused or directed onto a photoconducting gap (12). The probe further includes a transmission line (18, 20) associated with the photoconductive gap, and which terminates at a tapered end of the probe in contacts (22) which are placed on the device under test.</p>
申请公布号 EP0324110(A2) 申请公布日期 1989.07.19
申请号 EP19880120574 申请日期 1988.12.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HALBOUT, JEAN-MARC;KETCHEN, MARK BENJAMIN;MOSKOWITZ, PAUL ANDREW;SCHEUERMANN, MICHAEL ROY
分类号 G01R31/26;G01R1/067;G01R31/302 主分类号 G01R31/26
代理机构 代理人
主权项
地址