发明名称 |
Electrical signal sampling probe apparatus. |
摘要 |
<p>An electrical signal sampling probe apparatus to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate (10) though which optical pulses are focused or directed onto a photoconducting gap (12). The probe further includes a transmission line (18, 20) associated with the photoconductive gap, and which terminates at a tapered end of the probe in contacts (22) which are placed on the device under test.</p> |
申请公布号 |
EP0324110(A2) |
申请公布日期 |
1989.07.19 |
申请号 |
EP19880120574 |
申请日期 |
1988.12.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HALBOUT, JEAN-MARC;KETCHEN, MARK BENJAMIN;MOSKOWITZ, PAUL ANDREW;SCHEUERMANN, MICHAEL ROY |
分类号 |
G01R31/26;G01R1/067;G01R31/302 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|