发明名称 |
Method and apparatus for measuring jitter in a periodic signal. |
摘要 |
<p>Jitter in a clock signal is measured by using the clock signal to clock a digitizer repetitively digitizing a highly stable sine wave signal so as to produce a first data sequence representing the magnitude of the sine wave signal as a function of time. This first data sequence is normalized to produce a second data sequence having data elements that vary between maximum and minimum magnitudes of +1 and -1. The arcsine of each element of the second data sequence is then determined to provide a monotonically increasing third data sequence, wherein each element of the third data sequence indicates a phase angle associated with a corresponding element of the second data sequence. A fourth data sequence is then generated, each element of the fourth data sequence representing a difference between a phase angle represented by a corresponding element of the third data sequence and a phase angle that the corresponding element of the third data sequence would represent if the clock signal had a constant frequency. The fourth data sequence provides a measure of clock signal jitter as a function of time.</p> |
申请公布号 |
EP0324134(A2) |
申请公布日期 |
1989.07.19 |
申请号 |
EP19880121245 |
申请日期 |
1988.12.19 |
申请人 |
TEKTRONIX, INC. |
发明人 |
JENQ, YIH-CHYUN;CROSBY, PHILIP S. |
分类号 |
G01R13/20;G01R29/00;G01R29/02;G01R31/317;G01R31/3177 |
主分类号 |
G01R13/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|