发明名称 Optical heterodyne roughness measurement system
摘要 Two optical beams of different frequencies are focussed as concentric spots, one spot being larger than the other, on a reflective surface whose roughness is to be measured. The smaller spot has a maximum dimension that is smaller than any significant deviation of the profile of the surface from spatial uniformity, and the larger spot has a minimum dimension that is larger than any significant deviation of the surface profile from spatial uniformity. The two beams are reflected from the surface along a common path with a phase difference that is measured by a heterodyne interferometric technique. The phase difference measurement is indicative of the roughness of the surface, and is substantially insensitive to vibration of the surface.
申请公布号 US4848908(A) 申请公布日期 1989.07.18
申请号 US19830544506 申请日期 1983.10.24
申请人 LOCKHEED MISSILES & SPACE COMPANY, INC. 发明人 HUANG, CHENG-CHUNG
分类号 G01B11/30 主分类号 G01B11/30
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