发明名称 Apparatus and method for plasma-assisted etching
摘要 An apparatus for reactive ion etching or plasma etching wherein the wafer faces downward. The process gas is supplied through a distributor which is below the wafer and has orifices pointing away from the wafer. The vacuum (exhaust) port is below the distributor, so that there is no bulk gas flow near the face of the wafer. Preferably transport of the process gasses and their products to the face of the wafer is dominated by diffusion.
申请公布号 US4849068(A) 申请公布日期 1989.07.18
申请号 US19880211110 申请日期 1988.06.21
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 DAVIS, CECIL J.;CARTER, DUANE E.;JUCHA, RHETT B.
分类号 H01J37/32 主分类号 H01J37/32
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