发明名称 Determn. of error rate of individual signal steps - includes application of binary signal part and locally generated test signals to error rate measuring device
摘要 <p>The error rate determn. method relates to multiple step digital signals in a high bit rate digital transmission system. The N-step transmitted signal is converted into N-1 binary signal parts, so that each of them corresponds to a transition between two steps of the multiple step signal. N-1 binary test signals are locally generated. They represent the binary signal parts in a free from error state. A binary signal part corresponding to an examined step transition, and the locally generated test signals corresponding to the other step transitions, are combined and applied to an error rate measuring device. They are compared bit-by-bit by a modulo-2 addition. The decision threshold is set to a specified value.</p>
申请公布号 DE2643135(A1) 申请公布日期 1978.03.30
申请号 DE19762643135 申请日期 1976.09.24
申请人 SIEMENS AG 发明人 APPELMANN,WOLFGANG,DIPL.-ING.
分类号 H04L1/24;H04L25/04;(IPC1-7):03K13/32;04L25/04 主分类号 H04L1/24
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